XRD 2 - Bruker

  • High resolution powder diffraction
  • Powder and thin film samples
  • Thermal/vacuum stage capable of heating samples up to 1200°C
  • Independent Theta & 2-Theta control
  • Multichannel silicon strip detector
  • Goebel mirror for parallel x-ray beam
  • Low angle measurements down to 2°
  • Capillary sample holder for liquid samples
     

Tool Specs

Tool Status

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Manufacturer Bruker
Model D8 Advance
Typical Application High resolution powder diffraction
Location 6140.3
Related Documents Standard Operating Procedure
Training Contact Dennis Hsiao - hsiao@4dlabs.ca